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US 2011/0212602 A1Published application
Semiconductor device and method for manufacturing same
AssigneeRobert Bosch GmbH
InventorsAlfred GOERLACH, Ning Qu
Life of this patent
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Abstract
A semiconductor device includes a trench MOS barrier Schottky diode having an integrated PN diode and a method is for manufacturing same.
Claims9
1-27. (canceled)
A method for manufacturing a semiconductor device, comprising:
- applying an n-layer to an n+ substrate;
- creating trenches in the n-layer;
- covering the trenches with an oxide layer;
- removing the oxide layer from bottoms of the trenches and also from a portion of walls of the trenches;
- filling portions of the trenches freed of the oxide layer with p-doped Si or poly-Si to form p regions;
- and
- covering the n+ substrate and the n-layer with contact layers, the regions of the trenches not filled with p regions being filled completely with a material of the contact layer.
4 more elements
A method for manufacturing a semiconductor device, comprising:
- applying an n-layer to an n+ substrate;
- creating in the n-layer;
- covering the trenches with an oxide layer;
- removing the oxide layer from bottoms of the trenches in some areas;
- covering a portion of the bottoms of the trenches freed of the oxide layer with a dopant substance;
- performing a diffusion process to form p regions disposed beneath the trenches;
- and
- covering the n+ substrate and the n-layer with contact layers, the trenches being completely filled with a material of the contact layer.
5 more elements
Dependencies are inferred from the claim text.