Memory element, memory device, and semiconductor device
AssigneeSemiconductor Energy Laboratory Co., Ltd.
InventorsMikio YUKAWA, Nobuharu OHSAWA, Yoshinobu ASAMI
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AssigneeSemiconductor Energy Laboratory Co., Ltd.
InventorsMikio YUKAWA, Nobuharu OHSAWA, Yoshinobu ASAMI
Estimating the term…
On object of the invention is to provide a nonvolatile memory device, in which data can be added to the memory device after a manufacturing process and forgery and the like by rewriting can be prevented, and a semiconductor device including the memory device. Another object of the invention is to provide a highly-reliable, inexpensive, and nonvolatile memory device and a semiconductor device including the memory device. A memory element includes a first conductive layer, a second conductive layer, a first insulating layer with a thickness of 0.1 nm or more and 4 nm or less being in contact with the first conductive layer, and an organic compound layer interposed between the first conductive layer, the first insulating layer, and the second conductive layer.
A semiconductor device comprising:
A semiconductor device comprising:
A semiconductor device comprising:
A semiconductor device comprising:
Dependencies are inferred from the claim text.