Particle Beam Transport Apparatus And Method Of Transporting A Particle Beam With Small Beam Spot Size
AssigneeIon Beam Applications S.A.
InventorsMichel Abs, Szymon Zaremba, Willem Kleeven
Life of this patent
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Abstract
An apparatus for transporting a charged particle beam is provided. The apparatus may include: means for scanning the charged particle beam on a target, a dipole magnet arranged upstream of the means for scanning, at least three quadrupole lenses arranged between the dipole magnet and the means for scanning, and means for adjusting the field strength of at least three quadrupole lenses in function of the scanning angle of the charged particle beam. The apparatus can be made at least single achromatic.
Claims18
An apparatus (10) for transporting a charged particle beam to a target, the apparatus comprising:
- a scanning device configured to scan the charged particle beam on said target,
- a dipole magnet arranged upstream of the scanning device,
- at least three quadrupole lenses arranged between the dipole magnet and the scanning device for scanning, and
- an adjustment device configured to adjust a field strength of the at least three quadrupole lenses as a function of a scanning angle of the charged particle beam.
A method of transporting a charged particle beam to a target, the method comprising:
- transporting the charged particle beam from a beam generator to a scanning device the beam, with the charged particle beam bent over a nonzero angle at a location upstream of the scanning device,
- adjusting a magnetic and/or electrical field strength at three or more locations between the upstream location and the scanning device as a function of a scanning angle of the beam, and
- scanning the beam over the target.
12-15. (canceled)
A method for non-intrusive detection of materials, the method comprising:
- providing a scanning device for releasing a charged particle beam;
- providing a dipole magnet arranged upstream of the scanning device;
- providing at least three quadrupole lenses arranged between the dipole magnet and the scanning device;
- providing an adjusting device for adjusting a field strength of the at least three quadrupole lenses as a function of a scanning angle of the charged particle beam;
- and
- deflecting the charged particle beam over the materials in a time-dependent manner.
The method of claim 15, wherein the materials are cargo.
The method of claim 15, wherein the step of deflecting the charged particle beam over the materials is effective for sterilization.
The method of claim 15, wherein the step of deflecting the charged particle beam over the materials is effective for modification of the properties of the material.
Dependencies are inferred from the claim text.