Reliability test with monitoring of the results
AssigneeSTMicroelectronics S.r.l.
InventorsCarolina SELVA, Cosimo TORELLI
Life of this patent
Estimating the term…
Abstract
An embodiment for executing a reliability test is proposed. A corresponding electronic device includes functional means for implementing a functionality of the electronic device, and testing means for executing a test of the functional means including a plurality of test operations on the functional means; the testing means returns an indication of a result of each test operation. In an embodiment, the electronic device further includes control means for causing the testing means to reiterate the test, monitoring means for monitoring the result of each test operation to detect a failure of the test operation, and storage means for storing failure information indicative of temporal characteristics of each failure.
Claims38
An electronic device including functional means for implementing a functionality of the electronic device, and testing means for executing a test of the functional means including a plurality of test operations on the functional means, the testing means returning an indication of a result of each test operation,
- control means for causing the testing means to reiterate the test;
- monitoring means for monitoring the result of each test operation to detect a failure of the test operation;
- and
- storage means for storing failure information indicative of temporal characteristics of each failure.
A method for performing a reliability test on an electronic device including functional means for implementing a functionality of the electronic device and testing means for executing a test of the functional means including a plurality of test operations on the functional means, the testing means returning a result of each test operation, wherein the method includes the steps under the control of control means of the electronic device of:
- causing the testing means to reiterate the test;
- monitoring the result of each test operation to detect a failure of the test operation;
- and
- storing failure information indicative of temporal characteristics of each failure.
An integrated circuit, comprising:
- a functional circuit;
- a test circuit operable to cause the functional circuit to undergo a first test at a test time, to provide a result of the test, and to provide an indication of the test time;
- and
- a controller operable to store the test result and the indication of the test time if the functional circuit fails the test.
A system, comprising:
- a first integrated circuit, comprising:
- a functional circuit;
- a memory;
- a test circuit operable to cause the functional circuit to undergo a first test at a test time, to provide a result of the test, and to provide an indication of the test time;
- and
- a controller operable to store the test result and the indication of the test time in the memory if the functional circuit fails the test;
- and
- a second integrated circuit coupled to the first integrated circuit.
A method, comprising:
- causing a functional circuit on an integrated circuit to undergo a first test at a test time with a test circuit disposed on the integrated circuit;
- and
- storing a result of the test and an indication of the test time if the functional circuit fails the test with a controller disposed on the integrated circuit.
A tangible computer-readable medium operable to store programming instructions that when executed by a controller on an integrated circuit, are operable to cause the controller:
- to cause a functional circuit on the integrated circuit to undergo a first test at a test time with a test circuit disposed on the integrated circuit;
- and
- to store a result of the test and an indication of the test time if the functional circuit fails the test.
A testing apparatus, comprising:
- a conditioner operable to cause an integrated circuit to experience a test condition;
- and
- an analyzer operable to receive from the integrated circuit an identity of a functional circuit on the integrated circuit that fails a test during the test condition and a time of the failed test.
Dependencies are inferred from the claim text.