Test device
AssigneeQuanta Computer Inc.
InventorsShih-Wai Huang, Te-Hsin Chen, Chih-Hua Ho, Ming-Ying Yen
Life of this patent
Estimating the term…
Loading patent…
AssigneeQuanta Computer Inc.
InventorsShih-Wai Huang, Te-Hsin Chen, Chih-Hua Ho, Ming-Ying Yen
Estimating the term…
A test device for testing a system, which has first interface circuit, second interface circuit, and a power switch, comprises a power supply, status detector, and a controller. The power supply includes a supplying unit and a switch controller. The supplying unit provides a test power signal according to a wall wart signal. The switch controller enables the power switch to power the system with the test power signal in response to a control signal. The system boots according to operation system data provided via first interface circuit in response to the test power signal. The status detector generates a status detection signal indicating whether the system boots up successfully in response to an operation signal on the second interface circuit. The controller provides the control signal and processes the status detection signal.
A test device for testing a system comprising a first interface circuit, a second interface circuit and a power switch, wherein the test device comprises:
Dependencies are inferred from the claim text.