Method of manufacturing semiconductor device
AssigneeHitachi, Ltd.
InventorsTakashi Kobayashi, Shuntaro Machida, Kunio Hashiba
Life of this patent
Estimating the term…
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AssigneeHitachi, Ltd.
InventorsTakashi Kobayashi, Shuntaro Machida, Kunio Hashiba
Estimating the term…
A manufacturing yield of a semiconductor device (capacitive micromachined ultrasonic transducer) is increased. A plurality of first chips 1 in which a plurality of cells each having functions of transmitting and receiving ultrasonic waves are formed on a front surface of a first semiconductor wafer are manufactured, and each of the first chips 1 is judged as a superior/inferior product, and then, the first semiconductor wafer is sigulated into a plurality of first chips 1. Next, a plurality of second chips 2 in which a wiring layer is formed on a front surface of a second semiconductor wafer are manufactured, and each of the second chips 2 is judged as a superior/inferior product, and then, the second semiconductor wafer is sigulated into a plurality of second chips 2. Next, the plurality of first chips 1 judged as the superior product are adjacently arranged on the front surface of the second chip 2 judged as the superior product in plane in a Y direction so that lower electrodes 5 of the adjacent first chips 1 are electrically connected with each other via a through electrode 6, a bump 8, and a wiring layer 7.
A method of manufacturing a semiconductor device comprising the steps of:
Dependencies are inferred from the claim text.