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US 2011/0084928 A1Published application
Method and device for analyzing two-dimension sensing information
AssigneeEgalax_Empia Technology Inc.
InventorsChin-Fu Chang, Cheng-Han Lee, Chi-Hao Tang, Shun-Lung Ho
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Abstract
The method and device for analyzing two-dimension sensing information are disclosed. The two-dimension (2-D) sensing information is analyzed for determining touch related sensing information. The touch related sensing information may include touch related sensing information with inner lower values within outer high values and with inner higher values within outer low values.
Claims23
A method for analyzing 2-D sensing information, comprising:
- analyzing a first 2-D sensing information to determine each touch related sensing information with inner lower values within outer high values in the first 2-D sensing information.
A device for analyzing 2-D sensing information, comprising a controller and a host for performing an analysis, comprising:
- analyzing a first 2-D sensing information to determine each touch related sensing information with inner lower values within outer high values in the first 2-D sensing information.
Dependencies are inferred from the claim text.