Burn-In Testing System

Abstract

The present invention discloses a burn-in testing system including a burn-in board and a burn-in testing apparatus, the burn-in board including: a first interface component, adapted to connect with the burn-in testing apparatus for signal input and/or output between the burn-in board and the burn-in testing apparatus; and a second interface component, adapted to connect with a device under test for signal input and/or output between the burn-in board and the device, wherein the burn-in testing system further includes a pin matching unit flexibly connected with the burn-in board and adapted to adjust signal connection relationship between the first interface component and the second interface component according to a pin description of the device. By using the invention, burn-in tests of various devices having the same number of pins and different pin descriptions can be performed using the same burn-in board, which is compatible with existing burn-in boards, thereby improving production efficiency and reducing production costs.

Dependencies are inferred from the claim text.