Semiconductor device with dummy gate electrode and corresponding integrated circuit and manufacturing method
AssigneeNXP B.V.
InventorsJan Sonsky, Almudena Huerta
Life of this patent
Estimating the term…
Abstract
A field effect transistor semiconductor device configuration is described, which is particularly suitable for use in DC: DC converters associated with logic circuitry. The device includes a first gate electrode (18) which extends adjacent to its channel-accommodating region (14) and a second, dummy gate electrode (30) which extends adjacent to the drain drift region (12). The second gate electrode is electrically connected to the first gate electrode and serves to reduce the on-resistance of the device and improve its reliability by reducing hot carrier degradation.
Claims9
A semiconductor device including a semiconductor body, the semiconductor body comprising source and drain regions of a first conductivity type, and a channel-accommodating region of a second, opposite conductivity type which separates the source and drain regions, wherein the drain region comprises a drain contact region and a drain drift region, with the drain drift region between the channel-accommodating region and the drain contact region, and the drain drift region doped to a lesser extent than the drain contact region, the device further including a first gate electrode which extends adjacent to the channel-accommodating region, and a second gate electrode which extends adjacent to the drain drift region and is electrically connected to the first gate electrode.
Dependencies are inferred from the claim text.