SPM Imaging Apparatus, Probe and Method
AssigneeOrbital Instruments Limited
InventorsMartin F. Finlan, Shelley J. Wilkins
Life of this patent
Estimating the term…
Abstract
An elongate probe (50) for use in probe microscopy comprises a module (51) provided between a probe tip (53) and a driver (52). In use the driver (52) applies oscillations to the module (51) which are transmitted by the module to the tip (53). With the probe tip (53) positioned close to the surface of a sample, any phase variance in the oscillation of the tip with respect to the driving oscillation is representative of an interaction between the tip and the sample surface. The elongate arrangement of the probe (50) is particularly beneficial when used to probe samples which require a liquid environment.
Claims17
A scanning probe microscope for imaging a sample surface, the microscope comprising an elongate probe having a longitudinal axis oriented substantially orthogonal to the sample surface, the probe having a tip, a driver and a compliant elastic module disposed between the driver and the tip, the driver being adapted to axially oscillate the tip.
A method for imaging of a sample surface using a scanning probe microscope in accordance with any preceding claim, comprising bringing the probe in proximity with the surface and driving the probe tip in axial oscillation.
A method according toclaim 12, wherein the probe is raster scanned relative to the surface.
Dependencies are inferred from the claim text.