Design support program, design support device, and design support method
AssigneeFujitsu Semiconductor Limited
InventorsToshio HINO, Tsuyoshi SAKATA, Tomoyuki YAMADA
Life of this patent
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Abstract
A design support program stored in a recording medium readable by a computer includes acquiring a first analysis result including information about an area included in circuit information of a design target circuit and a second analysis result relating to a path of the circuit information, the temperature of the area being equal to or higher than a certain temperature; determining an arbitrary cell on a non-critical path from among cells arranged in the area as a target cell for decreasing the area temperature; and outputting a result of the determination.
Claims16
A design support program stored in a recording medium readable by a computer,
- executing, by the computer, operations of:
- acquiring a first analysis result including information about an area included in circuit information of a design target circuit and a second analysis result relating to a path of the circuit information, the temperature of the area being equal to or higher than a certain temperature;
- determining an arbitrary cell on a non-critical path from among cells arranged in the area as a target cell for decreasing the area temperature;
- and
- outputting a result of the determination.
A design support device comprising:
- an acquirer configured to acquire a first analysis result including information about an area included in circuit information of a design target circuit and a second analysis result relating to a path of the circuit information, the temperature of the area being equal to or higher than a certain temperature;
- a determiner configured to determine an arbitrary cell on a non-critical path from among cells in the area as a target cell for decreasing the temperature of the area;
- and
- an output configured to output a result of a determination.
A design support method executed by a computer, comprising:
- acquiring a first analysis result including information about an area included in circuit information of a design target circuit and a second analysis result relating to a path of the circuit information, the temperature being equal to or higher than a certain temperature;
- determining an arbitrary cell on a non-critical path from among cells arranged in the area as a target cell for decreasing the area temperature;
- and
- outputting a result of the determination.
Dependencies are inferred from the claim text.