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US 2011/0035638 A1Published application
Timing Failure Debug
OwnerRuifeng Guoinventor
Life of this patent
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Abstract
A debug flow that uses debug-friendly test patterns and logic fault diagnosis techniques to help physical fault isolation of timing failures.
Claims13
(canceled)
(canceled)
A method of debugging a circuit, comprising.
- identifying a target signal in a circuit that may propagate a fault;
- generating transition delay test patterns to propagate the fault along the target signal;
- applying the transition delay test patterns to the target signal;
- monitoring devices along a path of the target signal to identify a physical location of the fault;
- identifying side signals for devices in fan-out branches of a net along the path of the target signal;
- and
- applying constraint values to the side signals so that the side signal so that a transition on the test signal created by a transition delay test pattern is propagated to outputs of the devices in the fan-out branches.
4 more elements
A method of timing failure debug, comprising:
- selecting a target signal region in a circuit where a timing-related defect may exist and a propagation path that passes through the target signal region to an observation point where a timing failure caused by the timing-related defect can be observed;
- generating, under one or more constraints, a test pattern that can activate the timing-related defect and propagate the timing failure along the propagation path, the one or more constraints including a first constraint that some or all side inputs along the propagation path are set to non-controlling values;
- applying the test pattern to the circuit;
- and
- monitoring the circuit along the propagation path using a transition signal measurement technique.
2 more elements
Dependencies are inferred from the claim text.