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US 2011/0035637 A1Published application
Systems and devices including memory with built-in self test and methods of making and using the same
AssigneeMicron Technology, Inc.
InventorR. Jacob Baker
Life of this patent
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Abstract
Disclosed are methods, systems and devices, such as a device including a data location, a quantizing circuit coupled to the data location, and a test module coupled to the quantizing circuit. The quantizing circuit may include an analog-to-digital converter, a switch coupled to the memory element and a feedback signal path coupled to the output of the analog-to-digital converter and to the switch.
Claims33
A device, comprising:
- a data location;
- a quantizing circuit coupled to the data location;
- and
- a test module coupled to the quantizing circuit, wherein the test module is configured to test the data location;
- and
- wherein the quantizing circuit comprises:
- an analog-to-digital converter;
- a switch coupled to the data location;
- and
- a feedback signal path coupled to the output of the analog-to-digital converter and to the switch.
7 more elements
A system, comprising:
- a memory device comprising:
- a plurality of data locations;
- a delta-sigma modulator coupled to the plurality of data locations;
- a switch coupled to the plurality of data locations;
- a feedback signal path coupled to the output of the delta-sigma modulator and to the switch;
- a counter coupled to the delta-sigma modulator;
- and
- a built-in, self-test module coupled to the plurality of data locations.
5 more elements
A method, comprising:
- writing test data to a data location;
- reading the test data from the data location with a quantizing circuit, wherein
- reading comprises truncating a count;
- and
- determining whether the test data written to the data location corresponds to the test data.
2 more elements
A method, comprising:
- writing test data to a data location;
- reading the test data from the data location with a quantizing circuit;
- and
- determining whether the test data written to the data location corresponds to the test data;
- and
- adjusting one or more of a reference voltage, a number of bits truncated, and a sensing time duration, or a combination thereof in response to the determination.
3 more elements
A device, comprising:
- a test circuit;
- a memory element coupled to the test circuit;
- and
- a quantizing circuit coupled to the memory element, wherein the quantizing circuit comprises:
- an analog-to-digital converter;
- a switch coupled to the memory element;
- and
- a feedback signal path coupled to the output of the analog-to-digital converter and to the switch.
5 more elements
Dependencies are inferred from the claim text.