Data storage device and method for writing test data to a memory

A data storage device, comprising:

• a memory, comprising a data register;
• and
• a controller, coupled to the memory, writing test data to a memory space of the memory, sending a read-back command and a read-back address of the memory space to the memory to direct the memory to read the test data from the memory space to the data register, sending a copy-back command and a copy-back command in a test range of the memory to the memory to direct the memory to write the test data stored in the data register to the copy-back address, and repeat sending of the read-back command and the read-back address and sending of the copy-back command and the copy-back address when the test range of the memory has not been filled with the test data.

A data storage device, comprising:

• a memory, comprising a data register;
• and
• a controller, directing the memory to read test data from a read-back address of a memory space to a data register of the memory, directing the memory to write the test data stored in the data register to a copy-back address of a test range, repeating directing the memory to read the test data and directing the memory to write the test data when the test range of the memory has not been filled with the test data, directing the memory to read a plurality of read addresses to obtain a plurality of read-out data segments when the test range of the memory has been filled with the test data, comparing the read-out data segments with the test data, and recording the read addresses corresponding to the read-out data segments in a defect table when the read-out data segments are not identical to the test data.