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US 2011/0035635 A1Published application
Jtag controlled self-repair after packaging
AssigneeMicron Technology, Inc.
InventorsYoshinori Fujiwara, Masayoshi Nomura
Life of this patent
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Abstract
An integrated circuit containing memory includes IEEE 1149.1 (JTAG) controlled self-repair system that permits permanent repair of the memory after the integrated circuit has been packaged. The JTAG controlled self-repair system allows a user to direct circuitry to blow fuses using an externally supplied voltage to electrically couple or isolate components to permanently repair a memory location with JTAG standard TMS and TCK signals. The system may optionally sequentially repair more than one memory location using a repair sequencer.
Claims1
A memory repair system comprising:
- an integrated circuit configured to receive at least first, second and third signals on first, second and third external pins, respectively, comprising:
- a memory array;
- redundant circuit elements coupled to fuses and to the third external pin and configured to enable the fuses to be blown responsive to the third signal being asserted;
- and
- a repair controller coupled to the first and second external pins and configured to generate at least one internal repair command responsive to the first and second signals wherein the at least one internal repair command causes at least one memory location in the memory array to be permanently repaired by blowing at least some of the fuses.
2 more elements
Dependencies are inferred from the claim text.