Memory Controller with Loopback Test Interface
AssigneeApple Inc.
InventorsLuka Bodrozic, Sukalpa Biswas, Hao Chen, Sridhar P. Subramanian, James B. Keller
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AssigneeApple Inc.
InventorsLuka Bodrozic, Sukalpa Biswas, Hao Chen, Sridhar P. Subramanian, James B. Keller
Estimating the term…
In one embodiment, an apparatus comprises an interconnect; at least one processor coupled to the interconnect; and at least one memory controller coupled to the interconnect. The memory controller is programmable by the processor into a loopback test mode of operation and, in the loopback test mode, the memory controller is configured to receive a first write operation from the processor over the interconnect. The memory controller is configured to route write data from the first write operation through a plurality of drivers and receivers connected to a plurality of data pins that are capable of connection to one or more memory modules. The memory controller is further configured to return the write data as read data on the interconnect for a first read operation received from the processor on the interconnect.
A memory controller comprising:
A single integrated circuit comprising:
A memory controller configured to couple to an interconnect to receive memory operations from one or more memory operation sources and further configured to couple to a memory interface to communicate with one or more memory modules, the memory controller comprising:
Dependencies are inferred from the claim text.