System and method for precise measurement of deflection

A system for measuring deflection in a structure comprising:

• a detector array mounted on said structure;
• a light source adapted to focus a light beam on said detector array such that a spot of light is projected on said detector array at a position that is dependent on a deflection in said structure;
• and
• a processor adapted to receive detector signals from said detector array and in accordance therewith measure said position of said spot.

A system for controlling a surface shape of a structure comprising:

• a plurality of actuators adapted to adjust deflections in said structure;
• a plurality of detector arrays mounted on said structure;
• a light source adapted to focus a light beam on each detector array such that a spot of light is projected on each detector array at a position that is dependent on a deflection in said structure at said detector array;
• a processor adapted to receive detector signals from said detector arrays and in accordance therewith measure the position of each spot;
• a controller adapted to receive said position measurements and in accordance therewith generate a plurality of control signals for controlling said actuators to form a desired surface shape in said structure.