Method and apparatus for determining relevance values for a detection of a fault on a chip and for determining a fault probability of a location on a chip

A computer program for performing, when running on a computer, the method for determining relevance values, each relevance value representing a relevance of a combination of an input node of a first number of input nodes with a measurement node of a second number of measurement nodes for a detection of a fault on a chip, the method comprising:

• applying a third number of tests at the first number of input nodes, wherein each test of the third number of tests defines for each input node a test input choice;
• measuring for each test of the third plurality of tests a signal at each of the second number of measurement nodes to acquire for each measurement node of the second number of measurement nodes a third number of measurement values, wherein each measurement value is associated to the test it was measured for and to the measurement node it was measured at;
• determining the relevance values, wherein each relevance value is calculated based on a correlation between the third number of test input choices defined for the input node of the respective combination and the third number of measurement values associated to the measurement node of the respective combination.