Test method and device for memory device
AssigneeSamsung Electronics Co., Ltd.
InventorsSeongHwan Moon, Chul-Hoon Byun
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Abstract
Provided is a test method for a memory device including a plurality of storage regions and an SPO recovery unit. The test method stores data in the plurality of storage regions. The test method shuts off supply of power to the memory device and resupplies the power to the memory device. The test method determines an operational state of the SPO recovery unit after the resupplying step based on the stored data.
Claims19
A test method for a memory device including a plurality of storage regions and a Sudden Power Off (SPO) recovery unit, the test method comprising:
- storing data in the plurality of storage regions;
- shutting off supply of power to the memory device;
- resupplying the power to the memory device;
- and
- determining an operational state of the SPO recovery unit after the resupplying step based on the stored data.
A test device for a memory device including a plurality of storage regions and a Sudden Power Off (SPO) recovery unit, the test device comprising:
- a data generator configured to generate data;
- a switch configured to selectively supply power to the memory device;
- a processor configured to store data in the plurality of storage regions, to control the switch to shut off supply of power to the memory device and to resupply the power to the memory device, and the processor configured to determine an operational state of the SPO recovery unit after the resupply of power based on the stored data.
A test method for a memory device including a plurality of storage regions and a data recovery unit, the test method comprising:
- determining an operating state of the data recovery unit after a sudden power off of power supplied to the memory device based on data stored in the plurality of storage regions.
Dependencies are inferred from the claim text.