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US 2011/0032747 A1Published application
Variable resistance memory devices and methods of programming variable resistance memory devices
AssigneeSamsung Electronics Co., Ltd.
InventorsHong-Sik Yoon, Min-Young Park, In-Gyu Baek, Hyun-Jun Sim, Jin-Shi Zhao
Life of this patent
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Abstract
A variable resistance memory device includes a variable resistance memory cell, and a by-pass circuit configured to electrically by-pass a programming pulse supplied to the variable resistance memory cell after a resistive state of the variable resistance memory cell has changed in response to the programming pulse.
Claims25
A variable resistance memory device comprising:
- a variable resistance memory cell;
- a by-pass circuit configured to electrically by-pass a programming pulse supplied to the variable resistance memory cell after a resistive state of the variable resistance memory cell has changed in response to the programming pulse.
A variable resistance memory device, comprising:
- a variable resistance memory cell array comprising a plurality of variable resistance memory cells electrically connected between a plurality of bit lines and a plurality of words lines;
- a current limiting circuit which limits a cell current magnitude of the variable resistance memory cells;
- a by-pass circuit configured to electrically by-pass a programming pulse supplied to the variable resistance memory cells after a resistive state of the variable resistance memory cells has changed in response to the programming pulse.
A computing system comprising:
- a bus system;
- a central processing unit (CPU) operative coupled to the bus system;
- a non-volatile random access memory comprising non-volatile variable resistance memory cells, and a by-pass circuit configured to electrically by-pass a programming pulse supplied to the variable resistance memory cells after a resistive state of the variable resistance memory cells has changed in response to the programming pulse.
Dependencies are inferred from the claim text.