Specimen mount for microscopy
AssigneeProtochips, Inc.
InventorsStephen E. Mick, John Damiano, David P. Nackashi
Life of this patent
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Abstract
Devices, mounts, stages, interfaces and systems to be developed that allow for in situ manipulation, experimentation and analysis of specimens directly within an electron microscope.
Claims25
A system for in situ manipulation, experimentation and analysis of at least one microscopy specimen directly within a microscope, said system comprising a mount and a stage, wherein the mount and the stage are electrically connectable, and wherein the stage is electrically connectable to the outside of the microscope via a conduit.
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A method of manipulating, experimenting and analyzing a microscopy specimen in situ, said method comprising:
- placing a microscopy specimen on a device;
- fixturing the device in a mount;
- mateably interfacing the mount in a stage, wherein the mount and the stage are mechanically and electrically connectable;
- applying electricity to manipulate the specimen electrically, chemically and/or thermally;
- and
- detecting and analyzing the in situ changes.
Dependencies are inferred from the claim text.