US 2011/0032525 A1Published application

Liquid sample analyzing method

AssigneePanasonic Corporation

InventorsHideyuki Kurokawa, Koji Miyoshi, Masahiro Aga, Kenji Murakami, Takahiko Tanida, Ryosuke Yamada

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Abstract

Provided is a liquid sample analyzing method for analyzing an analyte in a liquid sample by using a test piece (1) on which overflow blocking lines (7) are formed to prevent the liquid sample from flowing to the outside from a passage region (3a) of an extended layer (3). In a state in which the liquid sample is not extended in the passage region (3a) of the extended region (3), the test piece (1) is measured so as to cross the passage region (3a) of the extended layer (3) and the overflow blocking lines (7). Thus in a state in which a difference in brightness is large between the passage region (3a) of the extended region (3) and the overflow blocking lines (7), it is possible to properly recognize the boundary portions between the passage region (3a) of the extended region (3) and the overflow blocking lines (7).

Claims16

Dependent claims

A liquid sample analyzing method using a test piece,

the test piece comprising an extended layer on which a liquid sample is extended,
the extended layer comprising:
overflow blocking lines for preventing the liquid sample from flowing to an outside from a passage region of the extended layer;
and
a colored portion that is provided on a part of the passage region of the extended layer and contains an immobilized reagent,
the analyzing method comprising:
extending the liquid sample added to the test piece, in the passage region of the extended layer;
and
analyzing a target analyte in the liquid sample by optically detecting coloring of the colored portion,
wherein in a state in which the liquid sample is not extended in the passage region of the extended layer, the analyzing method further comprises:
optically measuring the test piece so as to cross the passage region of the extended layer and the overflow blocking lines;
and
deciding a passage width of the extended layer based on measurement data.

10 more elements

Dependencies are inferred from the claim text.