Curve Tracer Signal Conversion for Integrated Circuit Testing

A universal socketless integrated circuit (IC) electrical test fixture, the test fixture comprising:

• a probing platform to accept an IC, the IC having electrical contacts formed on a bottom surface in an array of m rows, where each row includes n, or less contacts;
• a probe arm including p probe pins, where p is greater than, or equal to n;
• a clamping mechanism to mechanically interface the probe arm probe pins to a row of n IC contacts under test;
• a curve tracer with base, collector, and emitter ports;
• a curve tracer signal conversion device having an input connected to the curve tracer base port to accept a repeating sequence of stepped base signals, a signal input connected to a curve tracer port selected from a group consisting of the collector and emitter ports, and p signal outputs, where each signal output is connected to a corresponding probe pin;
• wherein the probe arm, clamping mechanism, and probe platform work in cooperation to electrically interface to any row of the IC contacts;
• and,
• wherein the probe pins are sequentially connected to the selected curve tracer port in response to a corresponding base step signal.