Socketless Integrated Circuit Contact Connector
AssigneeApplied Micro Circuits Corporation
InventorJoseph Patterson
Life of this patent
Estimating the term…
Abstract
A socketless integrated circuit (IC) contact connector is provided with an electrically conductive support post. An electrically conductive spring has a first end connected to the post, and a second end. An electrically conductive first wire has a first end connected to the spring second end, and a second end. An electrically conductive loop with a loop neck is connected to the first wire second end. Typically, the loop is formed in the first wire second end. The spring and loop work in cooperation to engage an IC contact.
Claims18
A socketless integrated circuit (IC) contact connector comprising:
- an electrically conductive support post;
- an electrically conductive spring having a first end connected to the post, and a second end;
- an electrically conductive first wire having a first end connected to the spring second end, and a second end;
- an electrically conductive loop with a loop neck connected to the first wire second end;
- and,
- wherein the spring and loop work in cooperation to engage an IC contact.
A universal socketless integrated circuit (IC) test fixture with a contact connector, the test fixture comprising:
- probing platform to accept an IC, the IC having electrical contacts formed on a bottom surface in an array of m rows, where each row includes n, or less contacts;
- a probe arm including p probe pins, where p is greater than, or equal to n;
- a clamping mechanism to mechanically interface the probe arm probe pins to a row of n IC contacts under test;
- an electrically conductive support post;
- an electrically conductive spring having a first end connected to the post, and a second end;
- an electrically conductive first wire having a first end connected to the spring second end, and a second end;
- an electrically conductive loop with a loop neck connected to the first wire second end;
- wherein the probe arm, clamping mechanism, and probe platform work in cooperation to electrically interface a first row of IC contacts;
- and,
- wherein the spring and loop work in cooperation to engage a single IC contact in a second row of IC contacts.
Dependencies are inferred from the claim text.