Semiconductor device and abnormality detecting method
AssigneeNEC Electronics Corporation
InventorsMamoru KAMIYA, Yoshinori HAZAKA
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AssigneeNEC Electronics Corporation
InventorsMamoru KAMIYA, Yoshinori HAZAKA
Estimating the term…
A semiconductor device comprises: a task state storage configured to store an executing state of a processing task of software executed by a CPU and to output an executing state signal to show the executing state of the processing task; a task validity judging section configured to acquire an interruption signal corresponding to the processing task based on a control of the CPU and the execution state signal, and to output a valid signal when the processing task is executed validly; a clear signal output section configured to output a clear signal in response to the valid signal; and a watchdog timer configured to clear a timer count value when the clear signal is acquired within a prescribed time and to output a reset signal when the clear signal is not acquired within the prescribed time.
A semiconductor device comprising:
An abnormality detecting method comprising:
Dependencies are inferred from the claim text.