Methods Of Solving A Process Function
AssigneeCorning Incorporated
InventorsDavid William Folmar, Mark Lee Humphrey, Shane David Seyler
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Abstract
Methods are provided for solving a process function for modification of a non-test die for use in extrusion of a honeycomb body. The process function is solved by comparing measured widths of a plurality of slots between pins of a test die in the post-removal state and measured widths of a plurality of slots between pins of the test die in the pre-removal state. Methods are also provided for modifying a non-test die for use in extrusion of a honeycomb body. Such methods remove non-test-die material from a plurality of pins of the non-test die based on application of the process function.
Claims20
A method of solving a process function for modification of a non-test die for use in extrusion of a honeycomb body, the method comprising the steps of:
- measuring widths of a plurality of slots between pins of a test die in a pre-removal state;
- removing test-die material from a plurality of the pins of the test die in the pre-removal state to obtain a plurality of pins of the test die in a post-removal state;
- measuring widths of a plurality of slots between pins of the test die in the post-removal state;
- and
- solving the process function based on comparison between the measured widths of the plurality of slots between pins of the test die in the post-removal state and the measured widths of the plurality of slots between pins of the test die in the pre-removal state.
A method of modifying a non-test die for use in extrusion of a honeycomb body, the method comprising:
- measuring widths of a plurality of slots between pins of a test die in a pre-removal state;
- removing test-die material from a plurality of the pins of the test die in the pre-removal state to obtain a plurality of pins of the test die in a post-removal state;
- measuring widths of the plurality of slots between pins of the test die in the post-removal state;
- solving a process function based on comparison between the measured widths of the plurality of slots between pins of the test die in the post-removal state and the measured widths of the plurality of slots between pins of the test die in the pre-removal state;
- and
- removing non-test-die material from a plurality of pins of the non-test die based on application of the process function.
Dependencies are inferred from the claim text.