Process for thick film circuit patterning
AssigneeE. I. Du Pont de Nemours and Company
InventorsATSUHIKO SATO, Isao Hayashi, Mamoru Murakami
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AssigneeE. I. Du Pont de Nemours and Company
InventorsATSUHIKO SATO, Isao Hayashi, Mamoru Murakami
Estimating the term…
The invention relates to forming an electrically functional pattern on a substrate and to a process for using a photosensitive element in combination with a sheet having a thick film composition applied to a support. The process for forming a pattern having electrically functional properties on a substrate comprises the steps of: (a) providing a photosensitive layer having a tacky surface disposed on a substrate; (b) image-wise exposing the photosensitive layer to form an imaged layer having tacky and non-tacky areas; (c) applying a sheet comprising at least one layer of a thick film composition disposed on a support to the imaged layer wherein the imaged layer is in contact with the thick film composition of the sheet; (d) heating the transfer sheet and the photohardenable layer to increase the adhesive strength between the thick film composition and tacky areas of the imaged layer; (e) removing the support wherein the thick film composition remains on the support in the non-tacky areas of the imaged layer and the thick film composition substantially adheres to the tacky areas of the imaged layer forming a patterned article; and (f) heating the thick film composition of the patterned article.
A process for forming a pattern having electrically functional properties on a substrate comprising the steps of:
A process for forming a pattern having electrically functional properties on a substrate comprising the steps of:
The process of claim 7 wherein the electrically functional powder is a conductor and is selected from the group consisting of gold, silver, copper, nickel, aluminum, platinum, palladium, molybdenum, tungsten, tantalum, tin, indium, lanthanum, gadolinium, boron, ruthenium, cobalt, titanium, yttrium, europium, gallium, sulfur, zinc, silicon, magnesium, barium, cerium, strontium, lead, antimony, conductive carbon, and combinations thereof.
Dependencies are inferred from the claim text.