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US 2010/0302841 A1Published application
Phase change memory apparatus and test circuit therefor
AssigneeHynix Semiconductor Inc.
InventorsDong Keun KIM, Tae Hun YOON
Life of this patent
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Abstract
A test circuit transfers data, which is generated by current supplied from an external source, to a memory cell in response to a test mode signal.
Claims16
A test circuit of a phase change memory apparatus that transfers data, which is generated by a current supplied from an external current source, to a memory cell in response to a test mode signal.
A phase change memory apparatus, comprising:
- a memory bank having a plurality of unit cell arrays;
- and
- a test circuit configured to transfer data, which is generated by a current supplied from an external current source, to the memory bank in response to a test mode signal.
A phase change memory apparatus, comprising:
- a write driver configured to apply a program current to an input/output line;
- and
- a test circuit configured to apply data, which is generated by a current supplied from an external current source, to the input/output line in response to a test mode signal.
A memory apparatus, comprising:
- a cell mat;
- at least one local bit-line switch and at least one local word-line switch;
- at least one global bit line switch;
- at least one write driver for driving the at least one local bit lines;
- at least one sense-amp input/output line disposed between the at least one global bit line switch and the at least one write driver;
- at least one sense-amplifier;
- and
- at least one test circuit;
- wherein the memory apparatus includes at least one test circuit, the memory apparatus is capable of operating in a test mode and in a normal write mode, the write driver provides a current to the at least one sense-amp input/output line when the memory apparatus operates in the normal write mode, and the at least one test circuit directly provides a current to the at least one sense-amp input/output line when the memory apparatus operates in the test mode.
6 more elements
Dependencies are inferred from the claim text.