Monolithic voltage reference device with internal, multi-temperature drift data and related testing procedures

A temperature-compensated electronic system comprising:

• an electronic subsystem that requires a substantially constant reference voltage;
• a monolithic voltage reference device comprising:
• a voltage reference circuit configured to provide a substantially constant output voltage;
• a memory containing within it:
• first non-room temperature information which is a function of an output voltage of the monolithic voltage reference device measured while the monolithic voltage reference device was tested at a first non-room temperature which was substantially different than a room temperature;
• and
• second non-room temperature information which is a function of an output voltage of the monolithic voltage reference device measured while the monolithic voltage reference device was tested at a second non-room temperature which was substantially different from the first non-room temperature and the room temperature;
• and
• a monolithic package containing both the voltage reference circuit and the memory but not the electronic subsystem,
• wherein the monolithic voltage reference device is configured to receive a query from a source external to the monolithic package and to return in response the temperature information which is stored in the memory;
• a temperature sensor external to the monolithic package configured to provide real-time temperature information about the temperature of the monolithic voltage reference device;
• a temperature compensation system external to the monolithic package configured to:
• receive the real-time temperature information from the temperature sensor;
• read the first non-room and second non-room temperature information from the memory within the monolithic voltage reference device;
• and
• provide compensation to the electronic subsystem for changes in the output voltage of the monolithic voltage reference device caused by changes in the temperature of the monolithic voltage reference device based on the real-time temperature information and the first non-room and second non-room temperature information.

A monolithic voltage reference device comprising:

• a voltage reference circuit configured to provide a substantially constant output voltage;
• a memory containing within it:
• first non-room temperature information which is a function of an output voltage of the monolithic voltage reference device measured while the monolithic voltage reference device was tested at a first non-room temperature which was substantially different than a room temperature;
• and
• second non-room temperature information which is a function of an output voltage of the monolithic voltage reference device measured while the monolithic voltage reference device was tested at a second non-room temperature which was substantially different from the first non-room temperature and the room temperature;
• and
• a monolithic package containing both the voltage reference circuit and the memory,
• wherein the monolithic voltage reference device is configured to receive a query from a source external to the monolithic package and to return in response the temperature information which is stored in the memory.