Test system and test method of semiconductor integrated circuit
AssigneeNEC Electronics Corporation
InventorShinsuke Hamanaka
Life of this patent
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Abstract
Provided is a test system of a semiconductor integrated circuit including an output device and an input device for conducting an input/output characteristics test of the output device and the input device inside the semiconductor integrated circuit. In the system, a transmission line provided in a test board where the semiconductor integrated circuit is mounted on establishes a wired connection between an external terminal of one circuit of one of the output device and the input device and external terminals of a plurality of circuits of another one of the output device and the input device.
Claims12
A test system of a semiconductor integrated circuit comprising an output device and an input device for conducting an input/output characteristics test of the output device and the input device inside the semiconductor integrated circuit, comprising:
- a test board where the semiconductor integrated circuit is mounted on;
- and
- a transmission line that is provided in the test board and establishes a wired connection between an external terminal of one circuit of one of the output device and the input device and external terminals of a plurality of circuits of another one of the output device and the input device.
A test method of a semiconductor integrated circuit comprising an output device and an input device for conducting an input/output characteristics test of the output device and the input device inside the semiconductor integrated circuit, comprising:
- establishing a wired connection between one circuit of one of the output device and the input device and a plurality of circuits of another one of the output device and the input device;
- and
- conducting the input/output characteristics test of the output device and the input device.
Dependencies are inferred from the claim text.