Probe device

A probe device which inspects electrical characteristics of an object to be inspected, the probe device comprising:

• a probe card comprising a support plate which supports a contactor that contacts the object to be inspected, and a circuit board disposed at a top surface side of the support plate;
• a reinforcing member having a part which is disposed at a top surface side of the circuit board and which reinforces the circuit board;
• a holding member which holds an outer peripheral portion of the reinforcing member,
• wherein fixing members fixed to the holding member are inserted into and pass through the outer peripheral portion of the reinforcing member,
• a plurality of guide holes which guide horizontal extension and contraction of the reinforcing member are formed to pass through the reinforcing member in a thickness direction of the reinforcing member,
• a length in a longitudinal direction of each of the guide holes is greater than a diameter of each of the fixing members when viewed from a plane, and
• a central line in the longitudinal direction of each of the guide holes passes through a center of the reinforcing member.