Tuner characterization methods and apparatus
AssigneeFreescale Semiconductor, Inc.
InventorsChristopher J. Roff, Basim H. Noori
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Abstract
Embodiments include methods and apparatus for characterizing a tuner. For a given tuner, a processing system is adapted to measure scattering parameters for a plurality of characterization points that are non-uniformly distributed across a Smith chart, and to store the scattering parameters in a tuner characterization file. Interpolation and extrapolation processes are performed to determine additional scattering parameters for a plurality of additional characterization points, which are also stored in the tuner characterization file.
Claims22
A method for characterizing a tuner, the method comprising the steps of:
- measuring scattering parameters for a plurality of characterization points that are non-uniformly distributed across a Smith chart;
- and
- storing the scattering parameters in a tuner characterization file.
A method for characterizing a tuner, the method comprising the steps of:
- measuring scattering parameters for a plurality of characterization points that are non-uniformly distributed across a Smith chart, wherein the plurality of characterization points is more densely distributed in a first region of the Smith chart, and is less densely distributed in a second region of the Smith chart;
- and
- storing the scattering parameters in a tuner characterization file.
An apparatus for characterizing a load-pull tuner, the apparatus comprising:
- a processing system adapted to measure scattering parameters for a plurality of characterization points that are non-uniformly distributed across a Smith chart, and to store the scattering parameters in a tuner characterization file;
- and
- data storage adapted to store the tuner characterization file in a retrievable format.
Dependencies are inferred from the claim text.