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US 2010/0301332 A1Published application
Detecting a Fault State of a Semiconductor Arrangement
OwnerDonald Dibra, Jens Barrenscheeninventors
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Abstract
Disclosed is a method for detecting a mechanical fault state of a semiconductor arrangement, using a temperature profile.
Claims25
A method for detecting a mechanical fault state of a semiconductor arrangement, the method comprising:
- obtaining a temperature profile that includes n temperatures, with n≧2, by determining a temperature with a temperature sensor at n different positions of the semiconductor arrangement;
- evaluating the temperature profile by evaluating a relationship of at least two of the n temperatures of the temperature profile;
- and
- detecting the presence of the fault state dependent on the result of evaluating the temperature profile.
1 more element
A semiconductor arrangement comprising:
- n temperature sensors, with n≧2, that are located at n different positions of the semiconductor arrangement and that provide temperature signals;
- and
- an evaluation circuit coupled to the temperature sensors, the evaluation circuit being adapted to evaluate a relationship of at least two of the n temperatures of a temperature profile, the evaluation circuit providing a state signal that indicates one of a normal state or a mechanical fault state dependent on a result of evaluating the temperature profile.
Dependencies are inferred from the claim text.