Tandem TOF Mass Spectrometer With High Resolution Precursor Selection And Multiplexed MS-MS
AssigneeVirgin Instruments Corporation
InventorMarvin L. Vestal
Life of this patent
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Abstract
A tandem TOF mass spectrometer includes a first TOF mass analyzer that generates an ion beam comprising a plurality of ions and that selects a group of precursor ions from the plurality of ions. A pulsed ion accelerator accelerates and refocuses the selected group of precursor ions. An ion fragmentation chamber is positioned to receive the selected group of precursor ions that is refocused by the pulsed ion accelerator. At least some of the selected group of precursor ions is fragmented in the ion fragmentation chamber. A second TOF mass analyzer receives the selected group of precursor ions and ion fragments thereof from the ion fragmentation chamber and separates the ion fragments and then detects a fragment ion mass spectrum.
Claims30
A tandem TOF mass spectrometer comprising:
- a) a first TOF mass analyzer that generates an ion beam comprising a plurality of ions and that selects a group of precursor ions from the plurality of ions;
- b) a pulsed ion accelerator positioned to receive the selected group of precursor ions, the pulsed ion accelerator accelerating and refocusing the selected group of precursor ions;
- c) an ion fragmentation chamber positioned to receive the selected group of precursor ions that is accelerated and refocused by the pulsed ion accelerator, at least some of the selected group of precursor ions being fragmented in the ion fragmentation chamber;
- and
- d) a second TOF mass analyzer that receives the selected group of precursor ions and ion fragments thereof from the ion fragmentation chamber, the second TOF mass analyzer separating the ion fragments and detecting a fragment ion mass spectrum.
A method of measuring mass-to-charge ratio, the method comprising:
- a) performing a first TOF mass analysis by generating an ion beam comprising a plurality of ions and then selecting a group of precursor ions from the plurality of ions;
- b) accelerating the selected group of precursor ions;
- c) fragmenting at least some of the selected group of precursor ions;
- and
- d) performing a second TOF mass analysis by separating the ion fragments and detecting a fragment ion mass spectrum.
Dependencies are inferred from the claim text.