Mass Spectrometer
AssigneeMicromass UK Limited
InventorsKevin R. Howes, Eliot Powell, Paul Read
Life of this patent
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Abstract
An ion source, a mass spectrometer and a method of enhancing the performance of an ion source for use with a mass spectrometer. The ion source has a housing incorporating an ion source enclosure defining a chamber and an outer cover remote from the chamber. A fluid flow passageway is provided between the ion source enclosure and the outer cover. The method of the invention comprising supplying to the ion source housing a regulated flow of fluid through the fluid passageways so as to maintain the ion source enclosure within a predetermined temperature range of substantially between 60° c. and 80° c. and preferably at 70° c.
Claims11
A method of enhancing the performance of an ion source for use with a mass spectrometer which ion source has a housing incorporating an ion source enclosure defining a chamber and an outer cover remote from the chamber and wherein a fluid flow passageway is provided between the ion source enclosure and the outer cover, the method comprising supplying to the ion source housing a regulated flow of fluid through the fluid passageways so as to maintain the ion source enclosure within a predetermined temperature range of substantially between 60° c. and 80° c.
An ion source housing for use with a mass spectrometer which housing incorporates an ion source enclosure defining a chamber and an outer cover remote from the chamber and wherein a fluid flow passageway is provided between the ion source enclosure and the outer cover which passageway has an inlet and at least one outlet positioned so as to encourage an efficient flow of fluid through said fluid flow passageway in order to maintain the ion source enclosure within a predetermined temperature range of substantially between 60 c and 80 c.
Dependencies are inferred from the claim text.