US 2010/0250193 A1 · SYSTEM AND METHOD FOR TESTING LIQUID CRYSTAL DISPLAY DEVICE

Abstract

A system for testing a liquid crystal display (LCD) device includes a testing device photographing and capturing an image of a defect generated on a substrate having a thin film array formed thereon, the testing device providing testing information on the defect, a ARPC automatically determining defectiveness of the substrate by an automatic determination method using a defect determining automation program designed based on a testing worker's determination method and behavior aspect, the captured image and the testing information on the defect, a PRPC determining defectiveness of the substrate based on the captured image and the testing information on the defect, if the defectiveness of the substrate is undeterminable by the ARPC, and a main server connecting the ARPC with the PRPC and storing the captured image and the testing information on the defect. The ARPC extracts characteristics of the defect by using the testing information on the defect and the ARPC analyzes the extracted characteristics of the defect to classify and calculate the degree of the defect.

Claims10

Dependent claims

A system for testing a liquid crystal display (LCD) device comprising:

a testing device photographing and capturing an image of a defect generated on a substrate having a thin film array formed thereon, the testing device providing testing information on the defect;
an automatic review host (ARPC) automatically determining defectiveness of the substrate by an automatic determination method using a defect determining automation program designed based on a testing worker's determination method and behavior aspect, the captured image and the testing information on the defect;
a passive review host (PRPC) passively determining defectiveness of the substrate based on the captured image and the testing information on the defect, if the defectiveness of the substrate is undeterminable by the ARPC;
and
a main server connecting the ARPC with the PRPC and storing the captured image and the testing information on the defect,
wherein the ARPC extracts characteristics of the defect by using the testing information on the defect and the ARPC analyzes the extracted characteristics of the defect to classify and calculate the degree of the defect.

3 more elements

A method for testing a LCD device comprising steps of:

photographing a defect generated in a substrate having a thin film array formed thereon and capturing an image of the photographed defect;
determining reliability of the captured image;
reviewing the defect and extracting characteristics of the defect, if it is determined that the captured image is reliable;
analyzing the extracted characteristics of the defect by a defect determining automation program designed based on a testing worker's determination method and behavior aspect, and classifying and calculating degree of the defect;
determining based on the result of the calculation whether the defectiveness of the substrate is determinable by the automatic determination method;
determining the defectiveness of the substrate by the automatic determination method if the defectiveness of the substrate is determinable by the automatic determination method;
and
determining the defectiveness of the substrate by a passive determination method if the defectiveness of the substrate is undeterminable by the automatic determination method.

5 more elements

Dependencies are inferred from the claim text.

System and method for testing liquid crystal display device

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System and method for testing liquid crystal display device

Life of this patent

Abstract

Claims10