Quantification of an absorber through a scattering medium

A method for determining a thickness of a scattering medium, comprising:

• for each one of at least two samples comprising a compound and having an index of refraction inferior to an index of refraction of said scattering medium,
• positioning a sample in physical contact with said scattering medium;
• propagating in said scattering medium an incident beam of light having a wavelength corresponding to an absorption wavelength of said compound such that an evanescent wave is generated at an interface between said scattering medium and said sample;
• and
• taking n intensity measurements of a reflected beam of light for said sample, n being superior to one;
• and
• determining said thickness using a multivariate curve resolution method, non-negativity constraints, and said n intensity measurements for said at least two samples.

A system for determining a thickness of a scattering medium, comprising:

• a processor in a machine, said processor being adapted to receive n intensity measurements of a reflected beam of light for at least two samples each comprising a compound, n being superior to one;
• and
• an application coupled to said processor, said application being configured for determining said thickness using a multivariate curve resolution method, non-negativity constraints, and said n intensity measurements for said at least two samples,
• for each one of said at least two samples, said reflected beam of light resulting from a propagation of an incident beam of light in said scattering medium being in physical contact with said sample such that an evanescent wave be generated at an interface between said scattering medium and said sample, an index of refraction of said scattering medium being superior to an index of refraction of said sample.

A system for determining a property related to one of an analysis sample comprising a compound and a scattering medium, said system comprising:

• a first support for receiving said analysis sample;
• a second support for receiving said scattering medium having an index of refraction superior to an index of refraction of said analysis sample, said scattering medium having at least one scattering layer, said first support and said second support being positioned such that said scattering medium and said analysis sample be in physical contact;
• a light source adapted to emit an incident beam of light having a wavelength corresponding to an absorption wavelength of said compound;
• at least one photodetector adapted to take n intensity measurements of a reflected beam light for said analysis sample, said reflected beam of light resulting from a propagation of said incident in said scattering medium such that an evanescent wave be generated at an interface between said scattering medium and said analysis sample;
• and
• a property determining module connected to said at least one photodetector and adapted to determine said property in accordance with said n intensity measurements of said reflected beam of light for said analysis sample.