Method for manufacturing nonvolatile storage device
AssigneeKabushiki Kaisha Toshiba
InventorsKazuhito NISHITANI, Eiji Ito, Machiko Tsukiji, Hiroyuki Fukumizu, Naoya Hayamizu, Katsuhiro Sato
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AssigneeKabushiki Kaisha Toshiba
InventorsKazuhito NISHITANI, Eiji Ito, Machiko Tsukiji, Hiroyuki Fukumizu, Naoya Hayamizu, Katsuhiro Sato
Estimating the term…
A method for manufacturing a nonvolatile storage device including: a plurality of first electrodes aligning in a first direction; a plurality of second electrodes aligning in a second direction nonparallel to the first direction and provided above the first electrodes; and a first storage unit provided between the first electrode and the second electrode and including a first storage layer, a resistance of the first storage layer changing by at least one of an applied electric field and an applied current, the method includes: stacking a first electrode film forming a first electrode and a first storage unit film forming a first storage unit on a major surface of a substrate; processing the first electrode film and the first storage unit film into a strip shape aligning in the first direction; burying a sacrifice layer between the processed first electrode films and between the processed first storage unit films; forming a second electrode film forming a second electrode on the first storage unit film and the sacrifice layer; forming a mask layer having a lower etching rate than the sacrifice layer on the second electrode film; processing the second electrode film into a strip shape aligning in the second direction nonparallel to the first direction by using the mask layer as a mask; removing a portion of the first storage unit film exposed from the sacrifice layer by using the mask layer as a mask to process the first storage unit film into a columnar shape including a side wall along the first direction and a side wall along the second direction; removing the sacrifice layer to expose the first storage unit film having been covered with the sacrifice layer; and removing the exposed first storage unit film.
A method for manufacturing a nonvolatile storage device including:
A method for manufacturing a nonvolatile storage device including:
A method for manufacturing a nonvolatile storage device including:
Dependencies are inferred from the claim text.