Method for producing group III nitride-based compound semiconductor device
AssigneeToyoda Gosei Co., Ltd.
InventorsToshiya Umemura, Masahiro Ohashi
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AssigneeToyoda Gosei Co., Ltd.
InventorsToshiya Umemura, Masahiro Ohashi
Estimating the term…
A method for producing a Group III nitride-based compound semiconductor device includes, before bonding a support substrate to an epitaxial layer formed on an epitaxial growth substrate, forming trenches in such a manner as to extend from the top surface of a stacked structure including the epitaxial layer to at least the interface between the epitaxial growth substrate and the bottom surface of the epitaxial layer. The trenches divide the epitaxial layer into extended device areas which encompass respective product device structures, and stress relaxation areas. A plurality of laser irradiations are performed for laser lift off such that, after each laser irradiation, the expanded device areas and the stress relaxation areas are formed by a laser-irradiated area and a laser-unirradiated area, and a strip-shaped laser-unirradiated stress relaxation area is formed at a boundary between the laser-irradiated area and the laser-unirradiated area.
A method for producing a Group III nitride-based compound semiconductor device in which a hetero-substrate is used as an epitaxial growth substrate and which comprises stacking an epitaxial layer of a Group III nitride-based compound semiconductor on the epitaxial growth substrate, bonding a support substrate to a top surface of the epitaxial layer via a conductive layer, and removing the epitaxial growth substrate by laser lift-off,
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