Sample testing apparatus and sample testing method
AssigneeSysmex Corporation
InventorsNobuhiro KITAGAWA, Hiroyuki Tanaka, Hiroo Tatsutani, Tomoyuki Asahara
Life of this patent
Estimating the term…
Loading patent…
AssigneeSysmex Corporation
InventorsNobuhiro KITAGAWA, Hiroyuki Tanaka, Hiroo Tatsutani, Tomoyuki Asahara
Estimating the term…
The present invention is to present a sample testing apparatus comprising: a transport unit for transporting a sample container through a first position and a second position; a testing unit for performing a test on the sample in the sample container transported to the first position; a determination result obtainer for obtaining one of a first determination result indicating that a second test is required and a second determination result indicating that the second test is not required; and a transport controller for controlling the transport unit so as to transport the sample container back to the first position, if the first determination result has been obtained, wherein the sample container is not transported beyond the second position from the first position side before any one of the first and the second determination result has been obtained.
A sample testing apparatus comprising:
A sample testing apparatus comprising:
A sample testing method comprising steps of:
Dependencies are inferred from the claim text.