Software-controlled maskless optical lithography using fluorescence feedback
AssigneeThe Trustees of Columbia University in the City of New York
InventorIoannis Kymissis
Life of this patent
Estimating the term…
Abstract
A software-controlled maskless optical lithography system uses fluorescence feedback to control an aspect of the lithography, such as light source dose, wavelength, or flashing instances or duration, spatial light modulator (SLM) pattern, an optics parameter, a beamsplitter control parameter, or movement or positioning of a stage carrying a target workpiece, such as a semiconductor wafer.
Claims36
An optical lithography apparatus comprising:
- a light source, configured to deliver light to a target substrate;
- a spatial light modulator (SLM), configured to controllably direct light from the light source to desired locations associated with the target substrate for performing lithography;
- a light detector, configured to detect a fluorescence feedback signal from the substrate in response to light delivered to the substrate from the light source;
- and
- a controller circuit, configured to receive information about the feedback signal from the light detector, and to use the information about the feedback signal to automatically adjusting at least one aspect of the lithography being performed using the SLM.
An optical lithography apparatus comprising:
- a light source, configured to provide light at a first wavelength to expose a photoresist of a target substrate, and configured to provide light at a second wavelength to induce a fluorescence response from the target substrate without exposing the photoresist of the target substrate for performing lithography;
- a spatial light modulator (SLM), configured to controllably direct light from the light source at the first or second wavelengths to desired locations of the photoresist of the target substrate;
- a fluorescence response detector, configured to detect a fluorescence response from the target substrate in response to light at the second wavelength received at the target substrate;
- and
- a controller circuit, configured to use information about the fluorescence response to control an aspect of lithography performed on the target substrate using the SLM.
An optical photolithography method comprising:
- selectively exposing a target substrate to a light source, including spatially modulating light using a spatial light modulator (SLM) for performing lithography, the selectively exposing including automatically directing light from the light source toward the substrate under programmatic control;
- measuring a fluorescence signal from the substrate in response to light directed from the light source toward the substrate;
- and
- using the fluorescence signal as a feedback signal to control the selectively exposing the substrate to the light source for the lithography being performed using the SLM.
(canceled)
(canceled)
(canceled)
(canceled)
(canceled)
(canceled)
(canceled)
Dependencies are inferred from the claim text.