Analysis of leaded components

A method to facilitate analysis of component leads, the method comprising:

• forming a picture of the leads, from which an image is extracted, apportioning the image and performing first and second scans of the portions of the image at a device;
• receiving, at a processor, data of each scan, and, at the processor, establishing a rule, based on the data of the first scan of any one portion, governing when to judge that the data of the second scan of the one portion indicates a defect, determining rule compliance for each of the second scans, judging that any one second scan in a non-compliance state indicates a defect, and reporting a location of the defect;
• and
• displaying the report to a user at a display unit disposed in signal communication with the processor.

A method to facilitate analysis of component leads, the method comprising:

• forming a picture of the leads, from which an image is extracted;
• apportioning the image;
• performing first and second scans of the portions of the image;
• establishing a rule, based on the data of the first scan of any one portion, governing when to judge that the data of the second scan of the one portion indicates a defect;
• determining rule compliance for each of the second scans;
• judging that any one second scan in a non-compliance state indicates a defect;
• reporting a location of the defect;
• and
• displaying the report to a user.