Inspection apparatus and method using penetrating radiation
AssigneeIllinois Tool Works Inc.
InventorsAlain Dekker, Jon Burgess
Life of this patent
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Abstract
Products in multiple lanes are passed side-by-side through X-ray inspection apparatus and an image is acquired. Different parts of the image corresponding to the different product lanes are subjected to different numerical processing, so that product anomalies are in each case readily visible or reliably detected using automatic threshold discrimination. The same X-ray power may therefore be used to inspect products having widely different X-ray attenuation characteristics.
Claims26
A method of inspection comprising the steps of:
- a) acquiring an image of an inspection zone;
- b) numerically processing the image, in which first and second parts of the image are subjected to independent numerical processing;
- c) passing a first series of items through the inspection zone so as to appear in the first part of the image, and
- d) passing a second series of items through the inspection zone so as to appear in the second part of the image.
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A method of inspection as claimed in claim 16 wherein the image data target calibration value is determined without the presence of any items in the inspection zone.
A method of inspection as claimed in claim 16 wherein the range factor is substantially from 20% to 120%.
Inspection apparatus comprising an inspection zone, means for acquiring an image of the inspection zone, means operatively arranged to numerically process first and second parts of the image independently, means for passing a first series of items through the inspection zone so as to appear in the first part of the image, and means for passing a second series of items through the inspection zone so as to appear in the second part of the image.
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Dependencies are inferred from the claim text.