Disk surface defect inspection method and apparatus
AssigneeHitachi High-Technologies Corporation
InventorsBin Abdulrashid FARIZ, Yu YANAKA, Keiji KATO, Takayuki ISHIGURO, Shigeru SERIKAWA
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AssigneeHitachi High-Technologies Corporation
InventorsBin Abdulrashid FARIZ, Yu YANAKA, Keiji KATO, Takayuki ISHIGURO, Shigeru SERIKAWA
Estimating the term…
The present invention provides a disk surface defect inspection method including: irradiating a laser beam from an oblique direction onto a disk surface being rotated; detecting intensities of a first light that is scattered with low-angle and a second light that is scattered with high-angle from minute concave and convex defects; determining that a defect is the minute convex defect if a ratio of the intensity of the first light to the intensity of the second light is constant; and determining that a defect is the minute concave defect if the ratio of the intensity of the first light to the intensity of the second light is changed.
A disk surface defect inspection method comprising:
A disk surface defect inspection apparatus comprising:
A disk surface defect inspection apparatus comprising:
Dependencies are inferred from the claim text.