Semiconductor memory device comprising variable delay circuit
AssigneeSamsung Electronics Co., Ltd.
InventorsDong-Su JANG, Yong-Ho CHO
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Abstract
A semiconductor memory device comprises a memory cell configured to output data to a pair of bitlines, a variable delay circuit configured to receive a sense amplifier enable signal, adjust a delay of the sense amplifier enable signal by changing a slope of a delay based on a variable external power supply voltage, and output a delayed sense amplifier enable signal, and a bitline sense amplifier configured to amplify a voltage difference between the pair of bitlines in response to the delayed sense amplifier enable signal and output the amplified voltage difference to a pair of input/output lines.
Claims11
A semiconductor memory device, comprising:
- a memory cell configured to output data to a pair of bitlines;
- a variable delay circuit configured to receive a sense amplifier enable signal, adjust a delay of the sense amplifier enable signal by adjusting a slope of a delay voltage based on a variable external power supply voltage, and output a delayed sense amplifier enable signal;
- and
- a bitline sense amplifier configured to amplify a voltage difference between the pair of bitlines in response to the delayed sense amplifier enable signal and output the amplified voltage difference to a pair of input/output lines.
Dependencies are inferred from the claim text.