Back to results
US 2010/0245833 A1Published application
System and method for measuring display quality with a hyperspectral imager
AssigneeQUALCOMM MEMS Technologies, Inc.
InventorHemang J. Shah
Life of this patent
Estimating the term…
Abstract
A system and method for measuring display quality by using a hyperspectral imager are disclosed. In one embodiment, the system comprises a hyperspectral imager configured to determine an intensity of light for a plurality of locations in a first area on a display for a plurality of spectral channels, and a processor configured to determine a measure of display quality based on the determined intensities.
Claims27
A method of measuring the quality of a display, the method comprising:
- determining an intensity of light with a hyperspectral imager for a plurality of locations in a first area of a display for a plurality of spectral channels;
- and
- determining a measure of display quality based on the determined intensities.
A system for measuring the quality of a display, the system comprising:
- a hyperspectral imager configured to determine an intensity of light for a plurality of locations in a first area on a display for a plurality of spectral channels;
- and
- a processor configured to determine a measure of display quality based on the determined intensities.
A method of generating a hyperspectral datacube, the method comprising:
- determining an intensity of light with a hyperspectral imager for a plurality of locations in a two-dimensional area of a display for a plurality of spectral channels;
- and
- storing the determined intensities in a datacube on a computer-readable storage, the datacube being indexed by at least a first parameter corresponding to a first direction, a second parameter corresponding to a second direction, and a third parameter corresponding to wavelength.
Dependencies are inferred from the claim text.