Soft error and transient error detection device and methods therefor
AssigneeFreescale Semiconductor, Inc.
InventorsWilliam C. Moyer, Troy L. Cooper
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AssigneeFreescale Semiconductor, Inc.
InventorsWilliam C. Moyer, Troy L. Cooper
Estimating the term…
A clock signal is received at a clock node of a latch module, and a data signal is received at a data node of the latch module. The data signal including information to be latched at a first latch of the latch module and at a second latch of the latch module. A first representation of the data signal to a first data node of the first latch is delayed relative to a second representation of the data signal to a corresponding first data node of the second latch to obtain a first timing requirement between the data signal and the clock signal relative to the first latch that is substantially different than a second timing requirement. An error signal is generated in response to different data being latched at the first latch than at the second latch.
A method comprising:
A device comprising:
A method comprising:
The method of claim 20 further comprising indicating an error condition based upon information latched at the first storage node and at the second storage node.
Dependencies are inferred from the claim text.