Test apparatus and driver circuit
AssigneeAdvantest Corporation
InventorsYasuhiro Urabe, Naoki Matsumoto, Yuji Kuwana
Life of this patent
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AssigneeAdvantest Corporation
InventorsYasuhiro Urabe, Naoki Matsumoto, Yuji Kuwana
Estimating the term…
Provided is a test apparatus that tests a device under test, comprising a driver circuit that generates an output signal according to a prescribed input pattern, and supplies the output signal to the device under test; and a measuring section that measures a response signal output by the device under test to judge the acceptability of the device under test, wherein the driver circuit includes an input gate drive section that selects one of a plurality of input drive voltages supplied thereto, according to a logic value of the input pattern, and outputs the selected input drive voltage; a voltage switching section that includes a transistor and that outputs the output signal according to the drain voltage of the transistor, the transistor having a gate terminal that receives the input drive voltage output by the input gate drive section and a source terminal to which is applied a prescribed reference voltage; and an input drive voltage supplying section that generates the input drive voltages according to the reference voltage, and supplies the input drive voltages to the input gate drive section.
A test apparatus that tests a device under test, comprising:
A driver circuit that generates an output signal corresponding to an input pattern, comprising:
A driver circuit that generates an output signal corresponding to an input pattern, comprising:
Dependencies are inferred from the claim text.