Method and apparatus for controlling position of z-axis for wafer prober

An apparatus for controlling a Z axis position of a wafer prober, the wafer prober including a chuck plate, a Z axis transferring unit for vertically transferring the chuck plate, and a Z axis base for supporting the Z axis transferring unit, comprising:

• a Z axis support plate interposed between the Z axis transferring unit and the Z axis base, and configured to support the Z axis transferring unit;
• a first sensor unit including a plurality of pressure sensors distributed and installed between the Z axis support plate and the Z axis base;
• a plurality of actuators distributed and installed below the Z axis support plate and configured to lift up or lower the Z axis support plate;
• an actuator driving unit configured to drive the plurality of actuators;
• and
• a control module configured to detect whether the Z axis support plate is tilted using pieces of sensed data provided by the pressure sensors of the first sensor unit, and to drive the actuators by controlling the actuator driving unit on a basis of results of the detection, thus enabling the chuck plate to be maintained in a horizontal state.