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US 2010/0244875 A1Published application
Scrub inducing compliant electrical contact
AssigneeDelaware Capital Formation, Inc.
InventorsScott Chabineau-Lovgren, Steve B. Sargeant, Mark A. Swart
Life of this patent
Estimating the term…
Abstract
The contact assembly having a contact member with a contact tip positioned within holes in a test socket or probe plate wherein the contact tip or the hole in the probe plate or test socket has a cam surface to provide lateral movement of the contact tip across a surface of a test location during compression of the contact member to induce scrubbing on the surface of the test site.
Claims18
A compliant contact assembly comprising:
- a contact member having a contact tip;
- means for allowing compression of the contact member;
- and
- a cam surface on the contact tip for inducing scrubbing of the contact tip with a test site during compression of the contact assembly.
1 more element
A contact assembly comprising:
- a test socket or probe plate having a plurality of spaced holes positioned therein;
- a compliant contact member having a contact tip positioned within at least a portion of the holes;
- means for biasing the contact member within the holes of the test socket or probe plate;
- and
- means for inducing a scrubbing movement of the contact tip with a test location during biasing of the contact member.
2 more elements
The method of scrubbing a test site by a compliant contact member comprising the steps of:
- compressing the compliant contact member within a test socket or probe plate by a test site;
- and
- laterally moving a contact tip on the contact member across a surface of the test site by engaging the contact member and the test socket along a cam surface on either the contact member or the test socket.
Dependencies are inferred from the claim text.